PLT-OS v1.1.4 includes the following changes since PLT-OS v1.0.18:
In PLT-OS v1.1.4, scan ANY can be used to scan any kind of barcode, without validating the barcode payload.
Example: scan ANY
- ident: BADGE-1 title: Scan steps: - command: scan ANY extractKey: BARCODE
Common user key expansion and extraction
User-defined keys are now expanded in every - command: Test Step, and keys can set with the result of any - command: Test Step, by adding an extractKey: option, similar to the extractKey: options that was already available for the -uartCmd: Test Step.
(Note that user key expansion for the - uartCmd: Test Step is not yet available)
You can now include distinct label templates for PASS and FAIL (template-pass.zpl and template-fail.zpl) as elements in a release.
Tip: Want to skip printing labels for test failures ? Just include an empty template-fail.zpl file.
A retry: option has been added to Test Plan Items and Test Steps.
Example: wait up to 3 seconds for voltage to drop below 1V:
- ident: 12V check retry: 3 steps: - command: sleepms 1000 - command: mux 0 RATP01 - command: measure voltageMUX0 <1V
Example: Up to 3 barcode scan attempts.
- ident: BADGE-1 title: Scan steps: - command: scan ANY extractKey: BARCODE retry: 3 - command: operator %BARCODE%
SWD/JTAG Clock Speed
With PLT-OS v1.1.x, the clock speed of SWD and JTAG communication can be overridden by adding a @<frequency> suffix to the target, as in:
- ident: ICT-002 title: Identify DUT steps: - command: identify nRF52@200kHz - command: sleepms 1000
Error responses from a custom Webhook are now included in the Test Report output of a serial request command.